The relation between recording mark formation and jitter value with Radial Orient Spot (ROS) type laser spot recording was investigated by using a new imaging method of conductive-atomic force microscopy (C-AFM). The readout performances of recording marks were studied by changing the terminal resistance of optical pickup head and writing strategies. The results of clear C-AFM images showed that is possible to adjust the conditions of terminal resistance and writing strategies to have better readout signal performance. Index Terms--Conductive-atomic force microscopy (C-AFM), jitter, recording mark, writing strategy.
Source Citation:Chu, Cheng Hung, Bau Jung Wu, Tsung Sheng Kao, Yuan Hsing Fu, Hai-Pang Chiang, and Din Ping Tsai. "Imaging of recording marks and their jitters with different writing strategy and terminal resistance of optical output.(Author abstract)." IEEE Transactions on Magnetics 45.5 (May 2009): 2221(3). InfoTrac General Science eCollection. Gale. BROWARD COUNTY LIBRARY. 14 June 2009
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